In the footsteps of Antoni van
Leeuwenhoek –
Advanced course on microscopy
November
3-12, Amsterdam/Rotterdam/Lunteren, The Netherlands
Program
Quality
control and characterization of confocal microscopes
Lauran Oomen
Intracellulair protein labeling and visualization by
confocal and correlative EM
Ben
Giepmans, Henk van Veen and Eric Reits
Calculation
of Confocal FRET from Images of Sensitized Emission
Kees Jalink
TCSPC:
fluorescence life-time determination by time-correlated single-photon
counting
Kees Jalink
LSI:
Large-Scale Imaging scanner
Kees Jalink, Leica
Frequency-domain fluorescence
lifetime imaging microscopy
Dorus Gadella, Joachim Goedhart,
Laura van Weeren
Spectral imaging microscopy and CLEM
Erik Manders/Ronald Breedijk
Total internal
reflection fluorescence (TIRF) and Spinning disk microscopy
Mark Hink, Dorus Gadella
4Pi microscopy
Gert van Cappellen
Fluorescent
redistribution after photobleaching (FRAP)
Adriaan Houtsmuller
CRYO-Electron
Microscopy
and Tomography of biological sections
Bridging the
gap between EM
and X-ray
P.
Peters and Nicole van
der Wel
The course
consist of 5 days
of practical sessions given in the UvA, NKI (Amsterdam) and Erasmus
MC (Rotterdam) November 3-7, 2 days of lectures (congress) during the
meeting for the
Dutch Society of Microscopy (NVvM), November 10-11, and a wrap up day
November
12 where the participant will have to give a presentation of there
practical work.
The number of
participants
is limited to 16 (4 groups of 4).
Costs: 300 euro.
Organizing committee:
AMC:
dr.
EAJ Reits, prof. dr. CJ van Noorden
ErasmusMC:
dr. AB Houtsmuller, dr. WA van
Cappellen,
NKI:
dr.
L Brocks, dr. K Jalink, dr. L Oomen, Prof. dr. PJ Peters, dr. N van
der Wel
UVA:
prof.
dr. TWJ Gadella
VUmc:
dr. J.A.M.
Beliën
deadline registration October 20
More
information:
http://www.ooa-graduateschool.org/html/2005/08/courses.html
Jeroen Belien: jam.belien at vumc.nl
NVvM meeting: http://www.microscopie.nl/
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