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Hi all,
The Advanced Imaging Center (AIC) and Janelia Group Leader Harald Hess are working together to introduce focused ion beam scanning electron microscopy (FIB-SEM) to the imaging center. We are actively looking for a research specialist/application scientist. The FIB-SEM we are building is custom-designed to be able to operate seamlessly for very long-term milling/imaging experiment (several months to a year is routine). The AIC FIB-SEM unit will be the 9th system of a large fleet of FIB-SEMs at Janelia.
More details on the FIB-SEM position can be found here:
https://tinyurl.com/y998bx5pJust to avoid any confusion, this job opening is in addition to another one that we have just announced less than a month ago which is for optical microscopy. The AIC is rapidly expanding its scope and its portfolio, we are looking for more highly motivated talents to join our exciting team! This position may eventually also be involved in several advanced correlative imaging techniques currently being developed at Janelia.
Regards,
Leong
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