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Begin forwarded message: Date: April 13, 2009 4:25:42 PM GMT+02:00 To: (alert recipient) Subject: Wiley Interscience Content Alert: Microscopy Research and Technique 72, 5
| | | Online ISSN: 1097-0029 Print ISSN: 1059-910X Microscopy Research and Technique Volume72, Issue5,2009. Early View (Articles Available Online in Advance of Print) Copyright © 2009 Wiley-Liss, Inc., A Wiley Company |
| | Research Articles | | 351-361 | The defensive secretion of Carabus lefebvrei Dejean 1826 pupa (Coleoptera, Carabidae): Gland ultrastructure and chemical identification Anita Giglio, Pietro Brandmayr, Renato Dalpozzo, Giovanni Sindona, Antonio Tagarelli, Federica Talarico, Tullia Zetto Brandmayr, Enrico A. Ferrero Abstract Published Online: 9 Dec 2008 DOI 10.1002/jemt.20660
| 362-370 | Accurate shape from focus based on focus adjustment in optical microscopy Seong-O Shim, Aamir Saeed Malik, Tae-Sun Choi Abstract Published Online: 9 Dec 2008 DOI 10.1002/jemt.20662
| 371-379 | Optimized protocol of a frequency domain fluorescence lifetime imaging microscope for FRET measurements Aymeric Leray, Franck B. Riquet, Elodie Richard, Corentin Spriet, Dave Trinel, Laurent Héliot Abstract Published Online: 15 Dec 2008 DOI 10.1002/jemt.20665
| 380-384 | Influence of calcitonin administration on ultimobranchial and parathyroid glands of pigeon, Columba livia Seema Yadav, Ajai Kumar Srivastav Abstract Published Online: 29 Dec 2008 DOI 10.1002/jemt.20682
| 385-397 | Recognition, presence, and survival of locust central nervous glia in situ and in vitro Daniela Gocht, Simone Wagner, Ralf Heinrich Abstract Published Online: 29 Dec 2008 DOI 10.1002/jemt.20683
| 398-402 | Digital titration: Automated image acquisition and analysis of load and growth of Chlamydophila psittaci Delphine S.A. Beeckman, Geert Meesen, Patrick Van Oostveldt, Daisy Vanrompay Abstract Published Online: 22 Jan 2009 DOI 10.1002/jemt.20694
| 403-410 | The influence of chromatic components on extended depth of field imaging Javier Navas, Joaquín Martín Abstract Published Online: 22 Jan 2009 DOI 10.1002/jemt.20685
| Copyright © 1999-2009 by John Wiley & Sons, Inc. All rights reserved.
---------------------------------------- Alberto Diaspro Head, Spectroscopy, Scanning Force and Nanoscopy Unit The Italian Institute of Technology -IIT Via Morego, 30 16163 - Genova (Italy) phone: +39 010 71781503 fax: +39 010 720321
Professor of Applied Physics Department of Physics University of Genova Via Dodecaneso, 33 16146 Genova - Italy tel. +39 010 353 6426 fax. +39 010 314218 -------------------------------------------------------
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