July 2008 Issue of Microscopy Today

[Ron Anderson-4]

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http://listserv.acsu.buffalo.edu/cgi-bin/wa?S1=confocal

Listers,

Here is the July 2008 Microscopy Today table of contents. I will
close the subscription list for this issue on Friday July 3rd, 2008. Sorry for the short notice--it is due to the requirement to have the magazine printed well before the M&M meeting in Albuquerque.

Microscopists in North America and MSA members anywhere qualify for free
subscriptions. Anyone else may subscribe for US$60 per year (to
PARTIALLY cover postage). All subscriptions at
http://www.microscopy-today.com .

Thank you,
Ron Anderson, Editor

=========================
How Much Force Does it Take to Move an Atom on a Surface?
Stephen W. Carmichael, Mayo Clinic

Beyond the Black Box: Interactive Global Docking of Protein Complexes
Jochen Heyd, Stefan Birmanns, University of Texas at Houston, School of Health Information Sciences, Houston, Texas

Comparing Binary Image Analysis Measurements – Euclidean Geometry, Centroids and Corners
Dennis W. Hetzner, Timken, Co.  Canton, Ohio

Confocal Laser Microscopy on Biofilms: Successes and Limitations
Betsey Pitts and Philip Stewart, Center for Biofilm Engineering, Montana State University, Bozeman, Montana

Extreme High-Resolution SEM: A Paradigm Shift
R. Young*, T. Templeton*, L. Roussel**, I. Gestmann**, G. van Veen**,  T. Dingle** and S. Henstra**  FEI, *Hillsboro, OR and **Eindhoven, The Netherlands

Testing Parameters for Two-Dimensional Crystallization and Electron Crystallography on Eukaryotic Membrane Proteins with Liposomes as Controls
G. Zhaoa, V. Mutucumaranab, D. Staffordb, Y. Kanaokac, K. F. Austenc and I. Schmidt-Kreya ,GA Inst. of Tech., Atlanta, UNC, Chapel Hill, NC, Harvard and Brigham and Women’s Boston, MA

A New Perspective on Mechanical Testing: In Situ Compression in the TEM
Julia Deneen Nowak, Zhiwei Shan and Oden L. Warren,*Hysitron Incorporated, Minneapolis, MN

Confocal Micro X-Ray Fluorescence: A New Paradigm in Materials Characterization
Brian M. Patterson, George J. Havrilla, Kimberly A. DeFriend, LANL, Los Alamos, NM

Hardware and Techniques for Cross-Correlative TEM and Atom Probe Analysis
B.P. Gorman,1 D. Diercks,1 N. Salmon,2 E. Stach,2 G. Amador,3 C. Hartfield,3 1U. of North Texas, Denton, TX, 2Hummingbird Scientific Instruments, Salem, OR,3Omniprobe, Inc., Dallas, TX

Imaging Skin Epidermal Stem Cells: A Review
Hilda Amalia Pasolli, The Rockefeller University New York, NY

Signature Analysis Applied to EDS Microanalysis
J.W. Colby & D. C. Ward, xk, Incorporated, Clackamas, OR

Cryo-Fracture or Freeze-Fracture, a Method to Expose Internal Tissue Surfaces and Cell Surfaces for Viewing in the Scanning Electron Microscope
Jeannette Taylor, Emory University, Atlanta, Georgia

SEM Remote Control with a 3D Option
F. Mighela, C. Perra, R. Pintus, S. Podda, M. Vanzi, Sardegna Ricerche, Pula, Italy and DIEE, U. of Cagliari, Cagliari, Italy

Coloring Pictures for Electron Microscopists or Elements of Digital Image Manipulation for Students
V.M.Dusevich, J.H.Purk, J.D.Eick, University of Missouri, Kansas City, MO

Industry News

NetNotes
  SPECIMEN PREPARATION – acetonitrile as a dehydration agent
  SPECIMEN PREPARATION - wicking or blotting grids
  SPECIMEN PREPARATION - sample mounting
  SPECIMEN PREPARATION – drying carbon paint for SEM
  SPECIMEN PREPARATION – dispersing particle for SEM
  SPECIMEN PREPARATION - sputter coating
  SPECIMEN PREPARATION – coating for SEM
  SPECIMEN PREPARATION – evaporating thick Al layers
  IMMUNOCYTOCHEMISTRY – brain tissue for EM
  DIGITAL IMAGING – resolution
  EM - algae in chiller
  EM - maximum length of vacuum lines
  EM - magnetic interference from UPS
  EM - filament life
  TEM - FFTs in focusing and removing objective astigmatism
  SEM - low keV imaging
  SEM - interference
  SEM – digital camera
  EDX problems

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