May 2008 Microscopy Today Table of Contents

[Ron Anderson-4]

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Listers,

Here is the May 2008 Microscopy Today table of contents. I will
close the subscription list for this issue on Friday May 9, 2008.

Microscopists in North America and MSA members anywhere qualify for free
subscriptions. Anyone else may subscribe for US$60 per year (to
PARTIALLY cover postage). All subscriptions at
http://www.microscopy-today.com .

Thank you,
Ron Anderson, Editor
=========================
Looking at Proteins Interacting and Folding inside Cells
Stephen W. Carmichael, Mayo Clinic

Life In and Under the Antarctic Ice Sheets
Shawn Doyle, Pierre Amato and Brent Christner Louisiana State University

Identifying Foreign Material Contamination in Food and Food Ingredients
V. L. St. Jeor, A. Lape, A. R. Muroski, C. McGuire, J.S. Kruger, and D.
L. Elmore, Cargill Incorporated, Excelsior, MN

Development of TV-rate CCD Cameras for in-situ Electron Microscopy
Lancy Tsung, Bill Mollon, Ming Pan, Yan Jia, Paul Mooney, and Chengye
Mao, Gatan, Inc. Pleasanton, CA

Signature Analysis Applied to EDS Microanalysis
J.W. Colby & D. C. Ward, xk, Incorporated, Clackamas, OR

Automated Image Acquisition of Polymer Blend Morphology in an SEM
C. S. Todd1, J. Blackson1, G. Bar2, E. Garcia-Meitin3, D. Reuschle3 M.
Janus4, M. Darus5 and A. Nickles5 , Dow Chemical, 1Midland, MI,
2Schkopau, Germany, 3Freeport, TX. FEI Company, 4Eindhoven, Netherlands,
5Hillsboro, OR

Surface Preparation of Uranium by Ion Milling
Donald A. Carpenter and Robert L. Bridges, Y-12 National Security
Complex, Oak Ridge, TN

Using Iodine Vapour Staining to Visualize Starch Distribution in a Dry,
Extruded Food
Jacquie Bond1 and Allan K Hardacre2 ,1 Scion Research Ltd, Rotorua, 2
New Zealand Institute for Crop & Food Research Ltd, Palmerston North,
New Zealand

A Method to Characterize and Correct Elliptical Distortion in Electron
Diffraction Patterns
Vincent D.-H. Hou and Du Li, Micron Technology, Inc., Boise, ID

Insect Epicuticular Grease Visualised by Scanning Probe Microscopy
Stanislav Gorb, Dagmar Voigt, Henrik Peisker, Max-Planck Institute for
Metals Research, Stuttgart, Germany

Functional Collaborative Remote Microscopy: Inter-Continental Atomic
Resolution Imaging
J .M. Perkins,* D. A. Blom,*** D. W. McComb,* and L. F. Allard**,
*Imperial College London, UK, ** Oak Ridge National Laboratory, Oak
Ridge, TN, ***University of South Carolina, Columbia, SC

Why is it Difficult to Simulate EBSD Patterns Accurately?
Alwyn Eades and Andrew Deal, Lehigh University, Bethlehem, PA

Quick Sample Preparation and EFTEM Elemental Characterization of FAB
Based Defects
C.T. Schamp, B.T. Valdez, J. Gazda, Cerium Labs, Austin, TX

Industry News

NetNotes
SPECIMEN PREPARATION – coloring Epon
SPECIMEN PREPARATION – heat fixation of bacteria
SPECIMEN PREPARATION – SEM of smooth muscle
SPECIMEN PREPARATION – fungi for SEM
SPECIMEN PREPARATION - cross section polishing for SEM
SPECIMEN PREPARATION - Labeling SiO2 particles
SPECIMEN PREPARATION – quantum dots for EM
SPECIMEN PREPARATION - immunogold staining of DNA and chitosan
MICROTOMY - picking up cryosections
IMMUNOCYTOCHEMISTRY – permeabilization
IMMUNOCYTOCHEMISTRY - colloidal gold
IMAGE PROCESSING – false color images LOW
IMAGE ANALYSIS - LOW
TEM camera problems
FESEM - exploding ceramics
ESEM – filament degradation
Scanning He-ion microscope
EDS - accuracy of thin film measurements
EDS - analysis on thin contaminant layer
EDS - effect of beam alignment on results MEDIUM
SILICON DRIFT DETECTORS - element mapping
INSTRUMENTATION – diffusion pump

Dear Abbe

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