Microscopy Today May 2009 Table of Contents

[Ron Anderson-4]

Listers,

Here is the May 2009 Microscopy Today table of contents. We will
close the subscription list for this issue on Wednesday, April 1, 2009. Sorry for the short time interval as we are trying to beat the May 11th postal rate increase.
Microscopists in North America and MSA members anywhere qualify for free
subscriptions. All subscriptions at
http://www.microscopy-today.com .

The July issue of MT will be totally reformatted with a new look and new features under Charles Lyman, the new editor. Not least of which will be an exact duplicate digital edition available nearly simultaneously. All URLs and emails in the digital edition will be live so that you may go to the desired link from within the digital edition.

Thank you,
Ron Anderson, Managing Editor

========================


Developmental Dynamics in Real Time
Stephen W. Carmichael, Mayo Clinic

Complexions: A Revolutionary Taxonomy for Grain Boundaries
Alwyn Eades, Lehigh University, Bethlehem, PA

Development of a 200kV Atomic Resolution Analytical Electron Microscope
T. Isabell*, et al., and I. Ishikawa**, et al. *JEOL USA, Inc., Peabody,
MA **JEOL Ltd., Akishima, Japan

Vibration Isolation Critical to Measuring Neuronal Patterns in the Brain
David L. Platus, Minus K Technology, Inc., Inglewood, CA

Phase Identification and Mapping Based on Valence Loss EELS and ELNES
R.D. Twesten, Gatan, Inc., Pleasanton, CA

Improved Techniques For Imaging Of Three-Dimensional Transparent
Specimens In Advanced Darkfield And Interference Contrast Modes
Jörg Piper, Clinic Meduna, Bad Bertrich, Germany

Low Energy, Low Angle, Large Area Ion Polishing for Improved EBSD Indexing
S.D. Walck*, J.R. Porter**, H-W. Yang**, S.S. Dheda**, *South Bay
Technology, Inc., San Clemente, CA, **UC Irvine, CA

Toward Robust High Resolution Chemical Imaging
C. A. Barrios, A. V. Malkovskiy, A. Kisliuk, A. P. Sokolov, M. D.
Foster, Dept. of Polymer Science, The U. of Akron, Akron, OH

Distinguishing the Data from the Dark: Single Source Software or
Microscopy Mix and Match?
Tim Oliver, Duke University Medical Center, Durham NC

Pioneers in Optics: Alhazen and Roger Bacon
Michael W. Davidson, National High Magnetic Field Laboratory, The
Florida State University, Tallahassee, FL

The Electron Gun its Saturation and Alignment—An Old Man’s Saga
Steve Chapman, Protrain, Buckingham, England

Determining the Micron Marker Distance or Magnification of a Microscopic
Image
Paul Beauregard, Chemist and Electron Microscopist, Greensburg, PA

A Very Simple Method for Quickly Making Large Numbers of Measurements on
Micrographs
Ron Anderson, Microscopy Today, Largo, FL

Dear Abbe

Industry News

NetNotes
SPECIMEN PREPARATION – waxy cuticles
SPECIMEN PREPARATION – TEM of fossil tooth
SPECIMEN PREPARATION – retinas
SPECIMEN PREPARATION - SEM of fibrin clots
SPECIMEN PREPARATION - liposomes
TEM - Oval beam
SEM – oil shale samples
SEM- magnetic materials
SEM – catholuminescence
EDX – broken detector window
EDX- mothball liquid nitrogen chilled detector
Convergent-beam electron diffraction – thickness measurement
Advertiser's Index