Microsocpy Today September 2007 Table of Contents

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Microsocpy Today September 2007 Table of Contents

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Listers,

Here is the September 2007 Microscopy Today table of contents. I will
close the subscription list for this issue on Thursday September 13th,
2007.

Microscopists in North America and MSA members anywhere qualify for free
subscriptions. Anyone else may subscribe for US$50 per year (to
PARTIALLY cover postage). All subscriptions at
http://www.microscopy-today.com . Subscription rate for non-qualified
readers will go to US$60 in 2008.

Thank you.

Ron Anderson, Editor
================================
Directing Traffic in Lymph Nodes
Stephen W. Carmichael and Ellen D. Remstein, Mayo Clinic, Rochester, MN

Multi-Length Scale Characterization of the Gibeon Meteorite using
Electron Backscatter Diffraction
Matthew M. Nowell and John O. Carpenter, EDAX-TSL, Draper UT

SEM Provides Critical Process Information in Pharmaceutical Applications
Ben Lich, FEI Company, Hillsboro, OR

Optimal Noise Filters in High-Resolution Electron Microscopy
K. Ishizuka, P. H. C. Eilers* and T. Kogure**, HREM Research Inc.,
Higashimatsuyama, Japan, *Utrecht University, Utrecht, The Netherlands,
**University of Tokyo, Tokyo, Japan

Quantification of Contaminant Removal by Evactron Cleaning Using Quartz
Crystal Thickness Monitors
Christopher G. Morgan, Mark M. Gleason and Ronald Vane, XEI Scientific,
Inc., Redwood City, CA

Reconstructing What Was: Software Applied to Serial Section TEM
Marcia D. Feinberg and John C. Fiala, Boston University, Boston MA

Overcoming Challenges in Material Science Testing with the use of Large
Specimen SEM Analysis
Adriana Romero, VisiTec of America LLC, Knoxville, TN

Microscopic analysis of magmatic crystals – Part 2: A SEM study of the
stability of accessory zircon under increasing metamorphic conditions
Robert Sturm, Department of Materials Engineering and Physics,
University of Salzburg/Austria

Specimen Preparation for SEM examination of Thin Polymer Films
Gan Phay Fang, Science & Technology Innovative Centre, Ansell Shah Alam
Sdn Bhd, Selangor, Malaysia

Applications of Focused Ion Beam (FIB) on Yeast Cell & SARS Virus
H. L. Hing1, C. Burkhardt2, P. Gnauck2, S. Sally3, H. Gelderbloms4, Y.
Muranaka5, M.A. Kaswandi1, A.H. A. Aziz1 & A.Z. Sahalan1. 1National
University of Malaysia, Kuala Lumpur, 2(NMI), Reutlingen, Germany,
3National University, Canberra, Australia, 4Robert Koch Institut,
Berlin, Germany, 5 Hamamatsu University School of Medicine, Hamamatsu, Japan

Advanced Metallographic Techniques Applied to Diesel Particulate Filters
Natalio Saenz, Heather Dillon, Shelley Carlson, & Gary Maupin, Battelle
PNNL, Richland, WA

New Approaches to Managing, Marketing, and Money for Maintaining a Core
Facility (4Ms)
Part 3: Marketing and Managing a Research Core/Facility
Pankaj Sharma, Purdue University

The Beginnings of the Southeastern Microscopy Society
W. Gray (Jay) Jerome, SEMS Historian

Industry News

NetNotes
SPECIMEN PREPARATION - colloidal gold conjugation of proteins
SPECIMEN PREPARATION – paraffin dewaxing
SPECIMEN PREPARTION – measuring resin components
SPECIMEN PREPARATION – fixation of low pH extremophiles
SPECIMEN PREPARATION – UV polymerization
SPECIMEN PREPARATION - SEM glue without carbon
TEM – calibration
TEM - 120 Kev vs 200 Kev instruments
TEM – cause of specimen damage
TEM & SEM terminology - kV or keV?
ELECTRON MICROPROBE - carbon coater
SEM/EDX - thin film thickness measurement**

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