NIST reference material for localization microscopy?

[Samuel M. Stavis]

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Hi everybody,
 
By way of introduction, I am a project leader at the National Institute of Standards and Technology (NIST):

https://www.nist.gov/people/samuel-stavis
 
My colleagues and I have an article in press about using aperture arrays as reference materials for localization microscopy:

https://arxiv.org/abs/1710.09803

Here is a research highlight summarizing our work:

https://www.nist.gov/news-events/news/2018/05/nist-puts-optical-microscope-under-microscope-achieve-atomic-accuracy

We are now considering developing the aperture array into a NIST Standard Reference Material:

https://www.nist.gov/srm

The essential issue is to have critical dimensions that are both accurate and precise, i.e. traceable to the SI with low uncertainty.
 
We are in the early stages of assessing interest in such a reference material. Could you please let me know if you would be interested in commenting on the design of such a reference material and/or testing prototypes?

Thanks,
Sam