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Dear colleague,
Optical microscopy has developed rapidly in the past years and most likely you have heard the acronyms SIM (structured illumination microscopy), STED (stimulated emission depletion), STORM (stochastic optical reconstruction microscopy) or PALM (photo-activation localization microscopy). All of these techniques have in common that they succeed in beating (or rather: circumventing) the diffraction limit of the optical microscope. Instead of a resolution of 200 nm, these techniques reach spatial resolutions of as low as 10 nm! But what exactly hides behind these acronyms? How can these techniques be employed?
We gathered a series of world experts in these techniques for a one-day Workshop on Super-Resolution, and we think that it offers a unique opportunity to become familiar with the technical approaches hiding behind the different acronyms. This workshop is organized in the context of the Annual Meeting of the Microscopical Society of Canada MSC-SMC 2011, but conference registration is not obligatory in order to participate at the workshop (scheduled for Friday, June 10, University of Ottawa).
We would like to ask you to post the attached flyer at your institutions and/or to forward it to colleagues, technicians and students who use optical, fluorescence or confocal laser scanning microscopy.
Information about all the workshops during the conference can be found here:
http://conference2011.msc-smc.org/doku.php?id=meeting2011:shortcourses:shortcoursesRegistration for both conference and workshops is possible here:
http://conference2011.msc-smc.org/doku.php?id=meeting2011:registration:registrationLooking forward to seeing you at the University of Ottawa in June!
Sincerely
Anja Geitmann
Chair of the program committee
MSC-SMC 2011
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