job opening microscopy / informatics (Institut Pasteur, Paris)

[Christophe Zimmer]

Search the CONFOCAL archive at http://listserv.acsu.buffalo.edu/cgi-bin/wa?S1=confocal

Engineer (Microscopy / Informatics)

Computational Imaging and Modeling Group, Institut Pasteur (Paris, France)

Our newly created group develops imaging and modeling approaches to quantitatively understand cell biological processes. We are looking for a highly motivated person with an engineering degree or a doctorate and solid experience in experimental optics and programming. The engineer will be in charge of developing novel light microscopy set-ups and data analysis software.  We expect a strong interest in learning new experimental techniques and computational tools, and the ability to work in a highly collaborative environment. Experience in biology is preferable but not required.

Institut Pasteur is a non-profit private foundation devoted to the prevention and treatment of diseases through biological research, education and public health activities. The institute is located in central Paris and offers a very attractive scientific environment with 2500 people working in 130 research groups on basic biological research and biomedical applications.

Institut Pasteur web site: http://www.pasteur.fr

To apply, please send CV and application letter quoting reference 08/002/CAR to: [hidden email]

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Groupe Imagerie et Modélisation
(Computational Imaging & Modeling Group)
CNRS URA 2582
Institut Pasteur
25-28 rue du Docteur Roux
75015 Paris
France
E-mail: [hidden email]
Tel: [phone]
Fax: [phone]

[John Hyun-2]

Search the CONFOCAL archive at http://listserv.acsu.buffalo.edu/cgi-bin/wa?S1=confocal Gatan 2008 Electron Microscopy Training Schools

EELS & EFTEM Analysis – Level I

• This course provides a thorough grounding in the basic theory and practice of EELS imaging and analysis in the TEM using Gatan hardware and software systems. No prior experience with EELS, EFTEM, or Gatan systems is assumed. A general familiarity with TEM instrumentation and techniques is strongly encouraged but not mandatory; allowances will be made to address the needs individual students.   In general, this course is recommended for TEM users with less than one year’s experience with Gatan analytical TEM products. By the end of the course, participants can expect to be able to operate Gatan hardware and software on a routine basis and carry out basic EELS analysis and EFTEM mapping.
• April 15 - 18, 2008
• Online Registration and school information: http://www.gatan.com/training/
  

EELS & EFTEM Analysis – Level II

• This advanced course briefly reviews the basic theory and practice of EELS imaging and analysis in the TEM, but its main emphasis is on practical techniques, optimum deployment of Gatan hardware and software systems, and advanced EELS and EFTEM applications. Prior experience with EELS, EFTEM, and Gatan systems is assumed, as is good familiarity with TEM/STEM instrumentation and techniques. As such, this course is recommended for researchers with a minimum of one year’s experience with both analytical TEM techniques and Gatan analytical TEM products. By the end of the course, participants can expect to know how best to optimize the performance of their Gatan spectrometer systems as well as their EELS and EFTEM experimental setups in order to capture and extract the maximum amount of information from their TEM samples.
• April 22-25, 2008
• Online Registration and school information: http://www.gatan.com/training/
  

TEM Specimen Preparation

• Hands on course designed to instruct the art and science of TEM specimen preparation using Broad Beam milling. The course concentrates on various ion milling techniques now available and demonstrates methods by which excellent TEM specimens can be produced from almost any material. Special attention will be given to the preparation of cross-sections through surfaces and interfaces. The materials used in the laboratory sessions will include semiconductors, metals, ceramics, and their combinations.
• April 28-30, 2008
• School Fee: $1,275.00 US Dollars; or $1,700.00 US when taken with SEM Specimen Preparation School.
  

SEM Specimen Preparation

• A course designed to teach a new method for preparing high-quality SEM and Light Microscopy specimens using an ion beam etching technique. This 3-day course is intended to offer users an alternative/replacement method to the traditional "wet" chemical etching technique used to decorate SEM samples. Attention will be given to preparation of IC SEM cross-sections and metallographic samples plus the PECS Slope Cutter / CP technique. The course focuses on the Gatan PECS, a dedicated multi-functional Broad Ion Beam Etching and Coating System.
• May 1-2, 2008
• Online Registration and school information: http://www.gatan.com/training/
  

Centar Frontier Training Course

• This course is designed to train new users on how to operate the Centar Frontier, an automated, computer controlled specimen preparation instrument for delayering and site specific SEM and TEM preparation. This 2-day course will provide users with practical education and hands-on training on advanced specimen preparation techniques for challenging applications. Users will learn step-by-step procedures for various applications that will take them from sample to final result.
• April 29-30 or May 1-2, 2008
• Online Registration and school information: http://www.gatan.com/training/