Posted by
Michael Giacomelli on
URL: http://confocal-microscopy-list.275.s1.nabble.com/Readout-noise-in-sCMOS-cameras-tp7588012p7588014.html
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Hi Sripad,
The read noise (error when measuring number of photoelectrons in a
pixel) distribution of (s)CMOS sensors is definitely not Gaussian. It
is an asymmetric distribution where a few pixels are essentially
noiseless, most have read noise a little less than the median value,
and then there are a long tail of increasingly bad pixels with much
higher read noise:
http://camera.hamamatsu.com/jp/en/technical_guides/read_noise/index.htmlThis noise reflects in part (I believe) the extent to which charge
becomes trapped in the insulating oxide layer around each pixel,
resulting in random fluctuations in electron counts. Since many CMOS
sensors have median read noise in the 1-5 electron range, it doesn't
take much trapped charge to have a big influence on photoelectron
counts. There is a lot of literature on making low noise CMOS pixels,
but I couldn't suggest any specific paper.
Mike
On Mon, Mar 5, 2018 at 12:54 PM, S Ram <
[hidden email]> wrote:
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>
> Hello Gerhard,
> This is a slightly off-topic question in connection to your recent response
> to the thread on the choice of sCMOS cameras.
>
> You made a comment that the distribution of noise in sCMOS is not Gaussian.
>
> Can you clarify whether you meant noise during the readout process (charge
> to voltage conversion step)? If it is not Gaussian, what is the underlying
> noise process? Is there any literature that you can point me to?
>
> Thanks.
>
> Sripad