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Re: -|EXT|- Re: Readout noise in sCMOS cameras

Posted by BROWNE Mark on Mar 06, 2018; 12:38am
URL: http://confocal-microscopy-list.275.s1.nabble.com/Readout-noise-in-sCMOS-cameras-tp7588012p7588015.html

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Here is a good paper on noise in emccd and sCMOS

arxiv 1506.07929

Mark
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> On Mar 5, 2018, at 7:02 PM, Michael Giacomelli <[hidden email]> wrote:
>
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>
> Hi Sripad,
>
> The read noise (error when measuring number of photoelectrons in a
> pixel) distribution of (s)CMOS sensors is definitely not Gaussian.  It
> is an asymmetric distribution where a few pixels are essentially
> noiseless, most have read noise a little less than the median value,
> and then there are a long tail of increasingly bad pixels with much
> higher read noise:
>
> http://camera.hamamatsu.com/jp/en/technical_guides/read_noise/index.html
>
> This noise reflects in part (I believe) the extent to which charge
> becomes trapped in the insulating oxide layer around each pixel,
> resulting in random fluctuations in electron counts.  Since many CMOS
> sensors have median read noise in the 1-5 electron range, it doesn't
> take much trapped charge to have a big influence on photoelectron
> counts. There is a lot of literature on making low noise CMOS pixels,
> but I couldn't suggest any specific paper.
>
> Mike
>
>> On Mon, Mar 5, 2018 at 12:54 PM, S Ram <[hidden email]> wrote:
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>> http://lists.umn.edu/cgi-bin/wa?A0=confocalmicroscopy
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>>
>> Hello Gerhard,
>> This is a slightly off-topic question in connection to your recent response
>> to the thread on the choice of sCMOS cameras.
>>
>> You made a comment that the distribution of noise in sCMOS is not Gaussian.
>>
>> Can you clarify whether you meant noise during the readout process (charge
>> to voltage conversion step)? If it is not Gaussian, what is the underlying
>> noise process? Is there any literature that you can point me to?
>>
>> Thanks.
>>
>> Sripad
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