NMR: possible impact on confocal microscopes?
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Jurkevic, Aleksandr |
NMR: possible impact on confocal microscopes?
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There are plans to install an NMR just above our light microscopy facility. At the moment we do not know the type of the instrument or how powerful the magnet will be. I am concerned about potential effects on confocal microscopes, cameras and electronic equipment. Please share our experience or suggestions.
Thank you. Alexander Alexander Jurkevich, PhD Associate Director Molecular Cytology Core University of Missouri 120 Life Sciences Center 1201 E. Rollins St. Columbia, MO 65211-7310 Phone: 573-882-4895 Fax: 573-884-9676 website http://www.biotech.missouri.edu/mcc/ |
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Sylvie Le Guyader |
Re: possible impact on confocal microscopes?
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Hi Alexander
I happen to have sent some information to someone about this last week so I copy and paste what I have gathered. I am afraid I cannot be of any help to explain the specs in the Zeiss document though. Here is the only relevant information I have about the microscope sensitivity to electromagnetic fields. This info is a few years old but I do not think it is outdated. This information was communicated to us by Zeiss a few years ago. Only alternating magnetic fields are a potential problem for electronic instruments. Permanent fields are not a problem. Piezo devices might be extra sensitive for magnetic fields but I am not sure if the sensitivity is towards alternating or permanent field. Below you can find the results of some tests that Zeiss ran on their systems. They have tested their microscope in the conditions translated in English (red) and all was fine so if the electromagnetic field in the microscope environment is below these specifications, there should be no problem. -------------------------------------------------------------------------------------------------------------------------------------- LSM 510 ; LSM510 DUO; LSM510 NLO Alle LSM Systeme von CZ-MI werden nach den gültigen Normen geprüft Störfestigkeit Laborgeräte Die LSM 5 Gerätesysteme werden auf EMV – Störfestigkeit geprüft. Grundlage ist die DIN EN 61326 (IEC 61326) „Elektrische Betriebsmittel für Leittechnik und Laboreinsatz“. Folgende Prüfungen werden durchgeführt und bei positiven Ergebnissen freigegeben: DIN EN / IEC 61000-4-2: elektrostatische Entladungen ESD auf Gehäuse: 4 kV kontaktentladung / 8kV Luftentladung Electromagnetic compatibility (EMC) - Part 4-2: Testing and measurement techniques; Electrostatic discharge immunity test 4 kV contact discharge / 8kV Air discharge DIN EN / IEC 61000-4-3: elektromagnetische Felder auf Gehäuse: 10 V/m, im Frequenzbereich 80MHz bis 2,7GHz Electromagnetic compatibility (EMC) - Part 4-3 : Testing and measurement techniques - Radiated, radio-frequency, electromagnetic field immunity test 10 V/m, im Frequency range 80MHz to 2.7GHz DIN EN / IEC 61000-4-4: schnelle Transienten Burst: auf Netzeingang 2 kV und auf Datenleitungen 1 kV. Electromagnetic compatibility (EMC) - Part 4-4: Testing and measurement techniques - Electrical fast transient/burst immunity test on ‘main’ input: 2 kV; on data lines: 1kV DIN EN / IEC 61000-4-5: Stossspannungen Surge.auf Netzeingang 1 kV; L1 gegen N, 2 kV, L1 und N gegen PE Electromagnetic Compatibility (EMC) - Part 4-5: Testing and measurement techniques - Surge immunity test 1kV; L1 to N 2kV, L1 and N to PE DIN EN / IEC 61000-4-6: Hochfrequenz auf Netzeingang und Datenleitungen. 3 V, Frequenzbereich 150kHz bis 80MHz Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques; Immunity to conducted disturbances, induced by radio-frequency fields 3 V, frequency range 150 kHz to 80 MHz DIN EN / IEC 61000-4-8: netzfrequentes magnetisches Feld auf Gehäuse: 50Hz / 60Hz, 30A/m Electromagnetic compatibility (EMC) - Part 4-8: Testing and measurement techniques; Power frequency magnetic field immunity test 50Hz / 60Hz, 30A/m DIN EN / IEC 61000-4-11: Kurzzeitunterbrechungen der Netzspannung: 20 ms Dauer auf 0 V Nennspannung Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests 20 ms duration to 0 V rated voltage Die oben angeführten Mindestwerte werden eingehalten und es kommt in dieser Umgebung zu keiner Schädigung des Systems. The environment described with the values quoted above did not damage the system. ------------------------------------------------------------------------------------------------------------------------------------- Med vänlig hälsning / Best regards Sylvie @@@@@@@@@@@@@@@@@@@@@@@@ Sylvie Le Guyader, PhD Live Cell Imaging Unit Manager Karolinska Institutet- Bionut Dpt Hälsovägen 7, Novum, G lift, floor 6 14157 Huddinge Sweden mobile: +46 (0) 73 733 5008 office: +46 (0) 8 5248 1107 LCI website -----Original Message----- From: Confocal Microscopy List [mailto:[hidden email]] On Behalf Of Jurkevich, Alexander Sent: den 13 november 2015 01:42 To: [hidden email] Subject: NMR: possible impact on confocal microscopes? There are plans to install an NMR just above our light microscopy facility. At the moment we do not know the type of the instrument or how powerful the magnet will be. I am concerned about potential effects on confocal microscopes, cameras and electronic equipment. Please share our experience or suggestions. Thank you. Alexander Alexander Jurkevich, PhD Associate Director Molecular Cytology Core University of Missouri 120 Life Sciences Center 1201 E. Rollins St. Columbia, MO 65211-7310 Phone: 573-882-4895 Fax: 573-884-9676 website http://www.biotech.missouri.edu/mcc/ |
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Bauchan, Gary |
Re: possible impact on confocal microscopes?
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Nov. 12, 2015
Alexander, Magnetic fields are only an issue with electron microscopes as they use large magnets to direct the electron beam. They hae no effect on a confocal microscope because they use light from lasers not electrons. Hope this helps. Gary R. Bauchan, Ph. D. Director, Electron & Confocal Microscopy Unit USDA-ARS 10300 Baltimore Ave. Bldg. 012, 5th St., BARC-West Beltsville, MD 20705 301-504-6649 -----Original Message----- From: Confocal Microscopy List [mailto:[hidden email]] On Behalf Of Sylvie Le Guyader Sent: Friday, November 13, 2015 7:44 AM To: [hidden email] Subject: Re: possible impact on confocal microscopes? Hi Alexander I happen to have sent some information to someone about this last week so I copy and paste what I have gathered. I am afraid I cannot be of any help to explain the specs in the Zeiss document though. Here is the only relevant information I have about the microscope sensitivity to electromagnetic fields. This info is a few years old but I do not think it is outdated. This information was communicated to us by Zeiss a few years ago. Only alternating magnetic fields are a potential problem for electronic instruments. Permanent fields are not a problem. Piezo devices might be extra sensitive for magnetic fields but I am not sure if the sensitivity is towards alternating or permanent field. Below you can find the results of some tests that Zeiss ran on their systems. They have tested their microscope in the conditions translated in English (red) and all was fine so if the electromagnetic field in the microscope environment is below these specifications, there should be no problem. -------------------------------------------------------------------------------------------------------------------------------------- LSM 510 ; LSM510 DUO; LSM510 NLO Alle LSM Systeme von CZ-MI werden nach den gültigen Normen geprüft Störfestigkeit Laborgeräte Die LSM 5 Gerätesysteme werden auf EMV – Störfestigkeit geprüft. Grundlage ist die DIN EN 61326 (IEC 61326) „Elektrische Betriebsmittel für Leittechnik und Laboreinsatz“. Folgende Prüfungen werden durchgeführt und bei positiven Ergebnissen freigegeben: DIN EN / IEC 61000-4-2: elektrostatische Entladungen ESD auf Gehäuse: 4 kV kontaktentladung / 8kV Luftentladung Electromagnetic compatibility (EMC) - Part 4-2: Testing and measurement techniques; Electrostatic discharge immunity test 4 kV contact discharge / 8kV Air discharge DIN EN / IEC 61000-4-3: elektromagnetische Felder auf Gehäuse: 10 V/m, im Frequenzbereich 80MHz bis 2,7GHz Electromagnetic compatibility (EMC) - Part 4-3 : Testing and measurement techniques - Radiated, radio-frequency, electromagnetic field immunity test 10 V/m, im Frequency range 80MHz to 2.7GHz DIN EN / IEC 61000-4-4: schnelle Transienten Burst: auf Netzeingang 2 kV und auf Datenleitungen 1 kV. Electromagnetic compatibility (EMC) - Part 4-4: Testing and measurement techniques - Electrical fast transient/burst immunity test on ‘main’ input: 2 kV; on data lines: 1kV DIN EN / IEC 61000-4-5: Stossspannungen Surge.auf Netzeingang 1 kV; L1 gegen N, 2 kV, L1 und N gegen PE Electromagnetic Compatibility (EMC) - Part 4-5: Testing and measurement techniques - Surge immunity test 1kV; L1 to N 2kV, L1 and N to PE DIN EN / IEC 61000-4-6: Hochfrequenz auf Netzeingang und Datenleitungen. 3 V, Frequenzbereich 150kHz bis 80MHz Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques; Immunity to conducted disturbances, induced by radio-frequency fields 3 V, frequency range 150 kHz to 80 MHz DIN EN / IEC 61000-4-8: netzfrequentes magnetisches Feld auf Gehäuse: 50Hz / 60Hz, 30A/m Electromagnetic compatibility (EMC) - Part 4-8: Testing and measurement techniques; Power frequency magnetic field immunity test 50Hz / 60Hz, 30A/m DIN EN / IEC 61000-4-11: Kurzzeitunterbrechungen der Netzspannung: 20 ms Dauer auf 0 V Nennspannung Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests 20 ms duration to 0 V rated voltage Die oben angeführten Mindestwerte werden eingehalten und es kommt in dieser Umgebung zu keiner Schädigung des Systems. The environment described with the values quoted above did not damage the system. ------------------------------------------------------------------------------------------------------------------------------------- Med vänlig hälsning / Best regards Sylvie @@@@@@@@@@@@@@@@@@@@@@@@ Sylvie Le Guyader, PhD Live Cell Imaging Unit Manager Karolinska Institutet- Bionut Dpt Hälsovägen 7, Novum, G lift, floor 6 14157 Huddinge Sweden mobile: +46 (0) 73 733 5008 office: +46 (0) 8 5248 1107 LCI website -----Original Message----- From: Confocal Microscopy List [mailto:[hidden email]] On Behalf Of Jurkevich, Alexander Sent: den 13 november 2015 01:42 To: [hidden email] Subject: NMR: possible impact on confocal microscopes? There are plans to install an NMR just above our light microscopy facility. At the moment we do not know the type of the instrument or how powerful the magnet will be. I am concerned about potential effects on confocal microscopes, cameras and electronic equipment. Please share our experience or suggestions. Thank you. Alexander Alexander Jurkevich, PhD Associate Director Molecular Cytology Core University of Missouri 120 Life Sciences Center 1201 E. Rollins St. Columbia, MO 65211-7310 Phone: 573-882-4895 Fax: 573-884-9676 website http://www.biotech.missouri.edu/mcc/ |
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Bauchan, Gary |
Re: possible impact on confocal microscopes?
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In reply to this post by Jurkevic, Aleksandr
Nov. 12, 2015
An NMR uses a very strong magnet. It should be placed on the ground floor as they are very heavy and far away from any electrical equipment. Any magnetic substances (metal) will be attracted to it. If you have a choice I would not put the NMTR near the microscopes. Gary R. Bauchan, Ph. D. Director, Electron & Confocal Microscopy Unit USDA-ARS 10300 Baltimore Ave. Bldg. 012, 5th St., BARC-West Beltsville, MD 20705 301-504-6649 -----Original Message----- From: Confocal Microscopy List [mailto:[hidden email]] On Behalf Of Jurkevich, Alexander Sent: Thursday, November 12, 2015 7:42 PM To: [hidden email] Subject: NMR: possible impact on confocal microscopes? There are plans to install an NMR just above our light microscopy facility. At the moment we do not know the type of the instrument or how powerful the magnet will be. I am concerned about potential effects on confocal microscopes, cameras and electronic equipment. Please share our experience or suggestions. Thank you. Alexander Alexander Jurkevich, PhD Associate Director Molecular Cytology Core University of Missouri 120 Life Sciences Center 1201 E. Rollins St. Columbia, MO 65211-7310 Phone: 573-882-4895 Fax: 573-884-9676 website http://www.biotech.missouri.edu/mcc/ |
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Mikhail A. Karymov |
Re: NMR: possible impact on confocal microscopes?
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In reply to this post by Jurkevic, Aleksandr
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To join, leave or search the confocal microscopy listserv, go to: http://lists.umn.edu/cgi-bin/wa?A0=confocalmicroscopy Post images on http://www.imgur.com and include the link in your posting. ***** Hi Alexander, I would recommend to ask NMR manufacturers about the potential effects of their instruments. I know for sure that people with pacers shouldn't enter the room with NMR instruments. NMR manufacturers should provide an exact answer for your question. Thank you. Mikhail. > There are plans to install an NMR just above our light microscopy > facility. At the moment we do not know the type of the instrument or how > powerful the magnet will be. I am concerned about potential effects on > confocal microscopes, cameras and electronic equipment. Please share our > experience or suggestions. > > Thank you. > > Alexander > > > Alexander Jurkevich, PhD > Associate Director > Molecular Cytology Core > University of Missouri > 120 Life Sciences Center > 1201 E. Rollins St. > Columbia, MO 65211-7310 > > Phone: 573-882-4895 > Fax: 573-884-9676 > website http://www.biotech.missouri.edu/mcc/ > > > > -- Mikhail A. Karymov, Ph.D. Associate Scientist California Institute of Technology 1200 East California Blvd. MC 101-20 Pasadena, CA 91125 e.-mail: [hidden email] Office: (626)395-3464 Cell: (402)960-7131 |
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